Test probes

Wafer testing is a step performed during semiconductor device fabrication. During this step, performed before a wafer is sent to die preparation, all individual integrated circuits that are present on the wafer are tested for functional defects by applying special test patterns to them. The wafer testing is performed by a piece of test equipment called a wafer prober. 

Semiconductor manufacturers use wafer probing as a first characterization of the parts on the wafer

We provide customized probes for wafer and integrated circuit package applications.